Dağlı Özkol, E.B., Eymur, S. and Tuğluoğlu*, N. 2025. Investigation of diode parameters of Al/Al2O3/n-Si Schottky diode produced by RF sputtering method according to current-voltage and capacitance-voltage characteristics. JOURNAL OF MATERIALS AND ELECTRONIC DEVICES. 2, 1 (Dec. 2025), 8–13.